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Bookmark or Share- Olympian Series - n&k Technology Inc. Metrology System, Semiconductor ...The n&k Olympian Series is our flagship high-throughput DUV-Vis-IR scatterometer/thin film metrology system with micro-spot technology, covering Reflectance measurements in the wavelength range from 190nm – 15,000nm.
- n&k Family of Products Inside v3 - n and kOverview of n&k Products The following charts demonstrate (approximately) the measurement capabilities of the UV-Vis-IR (Olympian) and UV-Vis-NIR systems (EclipSE-CD, OptiPrime-CD, LittleFoot-CD, Gemini-CD) for trench array and contact hole array measurements
- n&k Technology Inc. Metrology System, Semiconductor,Flat Panel Displayn&k’s unique combination of hardware + software allows for the monitoring of the most critical thin film & scatterometry applications. Experimental data with the highest signal-to-noise ratio over the widest wavelength range in the industry; Analysis of measured data based on valid physical models – Forouhi Bloomer Dispersion Equation and RCWA
- Company - n&k Technology Inc. Metrology System, Semiconductor,Flat ...The Clear Choice For Your Innovative Applications n&k Technology, Inc., of San Jose, California, was founded in 1992 by Drs. Rahim Forouhi and Iris Bloomer. The company manufactures exceptionally high resolution, state-of-the-art scatterometry (OCD) and thin film metrology tools for the semiconductor, photomask, data storage, flat panel display ...
- OptiPrime Series - n&k Technology Inc. Metrology System, Semiconductor ...The n&k OptiPrime series are high-throughput DUV-Vis-NIR scatterometers/thin film metrology systems, covering Reflectance measurements in the wavelength range from 190nm – 1000nm with micro-spot technology for monitoring Thin Film and Trench/OCD applications.
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